omron — Pattern Locator

Pattern Locator Pattern Locator Object Editor What is a Pattern? A pattern is defined as grid of pixels having a specific arrangement of grey-level values. A pat- tern must be created for each Pattern Locator tool. Properties ACEUser's Guide, 3.6.x, 18316-000 Rev A Page 582 Object Definition Properties Match Threshold Sets the Match Threshold of the Instance found by the tool (0 to 1). Maximum Instance Count Sets the maximum number of instances that the tool returns. Pattern Model The tool uses the user-defined pattern to identify the region of interest from the input image. Show Results Graphics Specifies if the graphics are drawn in the Vision Window.

Region of Interest (ROI) Offset Specifies the center and rotation of the ROI. X, Y, Degrees. Relative To Specifies the tool that will provide the input to this tool. The tool can be dragged from the Folder pane and dropped into this field. Search Area Defines the height and width of the region of interest. Advanced Bilinear Interpolation Enabled Specifies if bilinear interpolation is used to sample the input image. By default, bilinear interpolation is enabled because it improves accuracy. Custom Sampling Step When enabled, the tool uses the user-defined sampling step instead of the default optimal sampling step to sample the region of interest from the input image.