Ref :UM-CT7-11-001 Issue : 01 Date : 28/04/2011 Page 5 of 35 3 The CT7 instrument 3.1 Introduction The CT7 is dedicated to monitoring of the coating’s quality of the high grade optical surfaces. CT7 measures the specular reflection and (option) scattering index using seven wavelengths covering the range from UV to near IR. The user can use all of them or select the wavelengths which are interesting for his particular measurement. Measurements are performed few second after pressing the START, enabling gently placing on the precious mirror surface. Configurations of the instrument and data retrieval are facilitated by PC application CT‐7 Console. This document is OPO property.
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