Downloaded from https://www.everyspec.com AMCP 7J0hh Eample No. M4 Npn plana.r silicon transistors, life test. There were 2 classes for failure modes: tonto an& all-other; the results are shown for Ionic only, and for all failures combined, Th. table shows the test conditions and the raw failure da4, Temperature, IC Total-test-time, Failures 106 hr all ionDcO 172 0.128 0 0 200 1.816 1 0 220 0.125 0 0 240 0.125 0 0 205 0.123 a 8 290 0.104 18 18 320 0.102 17 12 360 0. 0". 88 a The results follow; the range it for a total of 4 standard deviationx: 1. All failurest a. activation energy 0.68 to 1.22 eV b. failure rate at 2F IC 0. 01 to 13.9 per 1011 hr 2. Ionic failures only: a.
activation energy 0.61 to 0.98 eV b. failure rate at 26 "C 0.47 to 836 per 1(01 hr. I.k. I i--II I