Downloaded from https://www.everyspec.com MIL-HDBK-816 NOTICE 1 8 April 2002 DEPARTMENT OF DEFENSE HANDBOOK GUIDELINES FOR DEVELOPING RADIATION HARDNESS ASSURANCE DEVICE SPECIFICATIONS TO ALL HOLDERS OF MIL-HDBK-816: 1. THE FOLLOWING PAGES OF MIL-HDBK-816 HAVE BEEN REVISED AND SUPERSEDE THE PAGES LISTED:

NEW PAGE DATE SUPERSEDED PAGE DATE iii 9 December 1994 iii Reprinted without change iv 8 April 2002 iv 9 December 1994 v 9 December 1994 v Reprinted without change 1 8 April 2002 1 9 December 1994 2 9 December 1994 2 Reprinted without change 3 8 April 2002 3 9 December 1994 4 8 April 2002 4 9 December 1994 5 8 April 2002 5 9 December 1994 6 8 April 2002 6 9 December 1994 7 8 April 2002 7 9 December 1994 8 8 April 2002 8 9 December 1994 9 8 April 2002 9 9 December 1994 10 8 April 2002 10 9 December 1994 11 8 April 2002 11 9 December 1994 12 8 April 2002 12 9 December 1994 13 8 April 2002 13 9 December 1994 16 8 April 2002 16 9 December 1994 17 8 April 2002 17 9 December 1994 18 8 April 2002 18 9 December 1994 19 9 December 1994 19 Reprinted without change 20 9 December 1994 20 Reprinted without change 21 8 April 2002 21 9 December 1994 22 8 April 2002 22 9 December 1994 23 8 April 2002 23 9 December 1994 24 9 December 1994 24 Reprinted without change 25 8 April 2002 25 9 December 1994 26 8 April 2002 26 9 December 1994 27 8 April 2002 27 9 December 1994 28 8 April 2002 28 9 December 1994 29 9 December 1994 29 Reprinted without change 30 8 April 2002 30 9 December 1994 31 9 December 1994 31 Reprinted without change 34 8 April 2002 34 9 December 1994 35 8 April 2002 35 9 December 1994 AMSC N/A AREA 59GP DISTRIBUTION STATEMENT A.

Approved for public release; distribution is unlimited. NOTICE OF METRIC CHANGE

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Downloaded from https://www.everyspec.com MIL-HDBK-816 NOTICE 1 38 8 April 2002 38 9 December 1994 39 9 December 1994 39 Reprinted without change 46 9 December 1994 46 Reprinted without change 47 8 April 2002 47 9 December 1994 54 9 December 1994 54 Reprinted without change 55 8 April 2002 55 9 December 1994 2. RETAIN THIS NOTICE AND INSERT BEFORE TABLE OF CONTENTS. 3. Holders of MIL-HDBK-816 will verify that page changes and additions indicated above have been entered. This notice page will be retained as a check sheet. This issuance, together with appended pages, is a separate publication.

Each notice is to be retained by stocking points until the standard is completely revised or canceled. Custodians: Preparing Activity: Army – CR DLA - CC Navy – EC Air Force – 19 DLA – CC (Project 59GP-0178) Review activities: Army – AR, SM Navy – AS, CG, MC, OS, SH Air Force – 11, 99 NASA – NA DTRA – TDAR

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Downloaded from https://www.everyspec.com MIL-HDBK-816 NOTICE 1 PREFACE This document discusses how data on the performance of an electronic part should be taken and documented so that it can be easily analyzed and how end-point limits for pass-fail lot acceptance tests should be calculated. Although these guidelines specifically address problems of radiation hardness assurance, many of the discussions given may be useful more generally to persons responsible for electrical response measurements and/or the development of procurement specifications. ACKNOWLEDGEMENTS The authors gratefully acknowledge the sponsorship of the Defense Nuclear Agency.

For their interest, support, and valuable comments, we particularly wish to thank LCDR Lewis Cohn and Capt. Claude Fore (DNA), Dr. Harvey Eisen (Harry Diamond Laboratories), Mr. John Adolphsen (NASA GSFC), Messrs. William Alfonte and Manfred Espig (Kaman Sciences Corp.), Dr. Itsu Arimura (Boeing Corp.), Drs. Dennis Brown and Edward Petersen (Naval Research Laboratory), Dr. Paltiel Buchman (Aerospace Corp.), Mrs. Mary Anne Dooley (TRW), Mr. James Ferry (AF Weapons Laboratory), Dr. Daniel Fleetwood (Sandia National Laboratories), Mr. Michael Gauthier, (ICS Radiation Technologies, Inc.), Mr. Michael Maher (National Semiconductor Corp.), Dr. George Messenger (Messenger Associates), Mr.

James Nicklaus (Defense Electronic Support Center), and Mr. Joseph Tirado (Harris Corp.). REPRINTED WITHOUT CHANGE. iii

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Downloaded from https://www.everyspec.com MIL-HDBK-816 NOTICE 1 CONTENTS PARAGRAPH PAGE 1. SCOPE ........................................................................................................................................ 1 1.1 Scope........................................................................................................................................ 1 1.2 Radiation hardness assurance at the piecepart level ................................................................ 1 1.3 LAT end-point limits ..................................................................................................................

1 1.4 Low yield devices ...................................................................................................................... 1 1.5 Generic qualification program.................................................................................................... 1 2. APPLICABLE DOCUMENTS ........................................................................................................ 3 2.1 Government documents ............................................................................................................ 3 2.2 Non-Government publications................................................................................................... 4 3.

ACRONYMS, DEFINITIONS, AND SYMBOLS ............................................................................. 4 3.1 Acronyms used in this standard ................................................................................................ 4 3.2 General usage for definitions and symbols................................................................................ 6 4. GENERAL CONSIDERATIONS.................................................................................................... 8 4.1 Device performance in the radiation environment......................................................................

8 4.2 Military Standard procurement system ...................................................................................... 9 4.3 Lot acceptance tests ................................................................................................................. 9 4.4 Part characterization ................................................................................................................. 13 4.5 Considerations beyond the scope of this document .................................................................. 13 5. DETAILED REQUIREMENTS.......................................................................................................

13 5.1 Characterization of piecepart performance in radiation environments ....................................... 13 5.2 Calculation of electrical parameter end-point limits ................................................................... 25 6. REFERENCES ............................................................................................................................. 36 6.1 References................................................................................................................................ 36 APPENDIX APPENDIX A. A listing of corresponding ERRIC and Military Standard symbols ....................... 38 APPENDIX B.

Evaluating data with cumulative probability plots on probability paper ................ 40 FIGURES 1. Proposed generic qualification system.......................................................................................... 2 2. Flow diagram for characterizing and specifying the performance of semiconductor devices in a radiation environment................................................................................................ 12 3. Flow diagram for characterizing the performance of semiconductor devices in a radiation environment.................................................................................................................... 15 4.

Steps for calculating end-point limits for lot acceptance tests ....................................................... 27 5. What is probability paper? ............................................................................................................ 41 6. Sample normal probability plot of 20 points – simulated data........................................................ 42 7. Plot of figure 6 with coloring and confidence lines......................................................................... 44 8. Ideal normal probability plot with 50 points – simulated data......................................................... 45 9.

Normal probability plot of 50 points with an overly good but still acceptable fit - simulated data......................................................................................................................... 46 10. Normal probability plot of 50 points with an exceptionally bad fit – simulated data........................ 48 11. Normal probability plot of actual data that exhibited systematic effects......................................... 49 12. Plot of figure 11 with confidence lines omitted and points “colored” .............................................. 50 13. Double example of possible outlier and step-stress data – actual data .........................................

51 14. Within-lot variations exceed lot-to-lot variations ............................................................................ 52 15. Interpreting of tests using n-3 equal-probability zones where n is sample size ............................. 53 16. Expected fraction of devices which exceed 90 percent confidence line Sample sizes of 20 and 100 ...................................................................................................... 54 17. Expected fraction of devices which exceed 10 percent confidence line Sample sizes of 20 and 100 ......................................................................................................

55 SUPERSEDES PAGE iv OF MIL-HDBK-816 iv

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