Downloaded from https://www.everyspec.com MIL-STD-810C Step 14 - With the test item de-energized, adjust the chamber (see note (f)),.and maintain until completion of the fourth operating time period. The test,.item temperature shall be stabilized. The test item shall be energized at the highest specified input voltage (see note (d)) and the chamber pressure adjusted to simulate the alti- tude specified in step 14 of table 504.1-11. The test item shall be operated four time periods each of the duration specified in step 14 of table 504.l-II, and shall be followed by a 15-minute period with the test item de- energized.
The test item shal1 be checked for satisfactory operation during each operating time period and the results recorded. Thermal sensor readings of the test item tempera- ture shal1 be recorded at the beginning and end of each operating time period. temperature to that specified in step14 of table 504.1-11 \ Step 15 - Adjust the chamber test conditions to standard ambient conditions. After the test item temperature has stabi- lized, an operational and performance check of the test item shall.be made and the results compared with the data obtained in General Requirements, 3.2.1, and evalu- ated using the criteria of General Requirements 3.2.4. ) Notes: a.
The following guidelines are provided for considerationwhen determining location of thermal sensors used to monitor the test items: (1) One or more sensors unit. in the ambient air within each major (2) Contact temperature on the largest mass in each major unit. (3) COntact temperature on the part(s) where temperature”is expected. the highest surface (4) Contact temperature on the part(s) whose to limit equipment performance. temperature is likely b. For equipment other than electronic equipment, the input conditions shall be such as to produce the minimum internal physical stress. 504.1-7 METHOD-504.1