Downloaded from https://www.everyspec.com 19 July 1983 MIL-STD-810D . (b) Stored at low temperatures. (c) Manipulated at low temperature. .-.(2)The test by: conditions that are used during the test are determined (a) The expected temperature at the deployment location. (b) The expected duration at the deployment location. (c) The test item configuration. (d) Additional guidelines as appropriate. 1-3.1 ~ce of test DrOCedU a. the test lta. From the requirementa documents, determine the functions to be performed by the equipment in a low-temperature environment and any limiting conditions, such aa storage. b. The primary objectives of the low-temperature test are to determine if:
(1) The test item can meet the performance specifications after storage or during operation in a cold environment. (2) The test item can be operated safely during or folIowing low- temperature exposure. (3) The handling (manipulation)required,to make the teat item operational can be conducted without affecting its functional performance. Based on this information and the purpose of the test item, determine what test data are necessary to ascertain to what extent the teat item will satiafy its low-temperature requirem”ents. c. i3electi0nof the test Drocedure(d. Three test procedures are included within method 502.2: storage, operation, and manipulation.
Baaed the teat data requirements, determine which test procedure, combination, or eequence of procedures ia applicable. In most cases, all three procedures should be applied. on c (1) Procedure I is appropriate if the test item is llkely to be stored at low temperatures during its service life. Procedure I is used when it is necessary to determine how low-temperature storage affects the test itemts safety or performance. . (2) IXocedure II - ODeca.td.m. Procedure II is L!Sedto determine the performance of the test item at low temperature and can be preceded by procedure I , procedure III, or both. If the test item is to be stored-at low METHOD 502.2. 19 July 1983, 502.2-3