Downloaded from https://www.everyspec.com MIL-STD-810D 19 July 1983 (3) Ms&diud z ass Glass, ceramics, and glass-type products (such as those used in optic~l s~stems, laser syetems, and electronic systems) that require mounting or restraining in specific poeitions may experience static fatigue. A more extended period of low temperature may be required to induce this phenomenon. A 24-hour exposure usually gives an 87 percent probability of uncovering this type of design defect. c. MssaKaiL?n . The configuration of the test item is an important factor.in how temperature affects it. Therefore, the “anticipated configuration of the test item during storage or use should be used during the teat.
Aa a minimum, the following configurations should be considered: . (1) In a shipping/storage container or transit case. .. (2) Protected or unprotected. (3) Deployed (realistically or with restraints,’such as with openings that are normally oovered). ,. (4) Modified with kits for special applications. d. ~ . . . mndeti. Review the equipment specifications and requirements documents. Apply any additional guidelines necessary. 1-4.1” Failure analvsia. The failure of a teat item to meet the requirements of the equipment specification must be analyzed carafully, and related information must be considered, such as: a.
Nondestructive test/examination following exposure to low temperature may be conducted at the low test temperature. b. Degradation allowed in operating characteristics when at low tem’pertiturea. c. Necessity for special kita or special cold-weather procedures. d. Evidence of improper lubrication and assurance that lubricants speoified for the environmental condition were used. e. For starting failures on internal-combustion engines, assurance of the presence of proper fuels and deicers, if appropriate. f. Condition and adequacy of the power source. I-4.2 &I ti rmati ired. The following information is required in the test plan for adequate conduct of the tests of section II. a.
Test procedure(s). ,. b. Test duration. METHOD 502.2 ... 19 July 1983 502.2-7