Downloaded from https://www.everyspec.com MIL-STD-81OC 10 March 1975 ‘!,, TEMPERATURE sHocK METHOD 503.1 4. ..,.. ,.,;p, 1. PURPOSE. The temperature shock test is conducted d’&&nine the effect on e-t of sudden changes in temperature of the surrounding atmosphere. 1.1 General effects. Adverse effects could occur in service due to rapid altitude changes during shipments and airdrops. 2. APPARATUS. A high temperature chamber and a low temperature chamber. 3. PROCEDURE 3.1 Procedure I :;12::r!5. Step 1 n Prepare the test item in accordance with General Requirements 3.2 and raise the internal chamber temperature to 71° C (160”F).
Maintain for a period of not less than 4 hours or until the test item stabilizes. :, Step 2 - At the conclusion of this time period, the test item shall be transferred, within 5 minutes, to a cold chamber with an internal chsmber temperature of -57°C (-70”F). Step 3 - The test item shal1 be exposed to this temperature for a period of not less than 4 hours or until the test item stabilizes. Step 4 - At the conclusion of this time period, the test item shall, within 5 minutes be returned to the high temperature chamber maintained at 71”C (160”F). Step 5 - The test item shall be exposed to this temperature for a period of not less than 4 hours or until the test item stabilizes.
Step 6 - Repeat steps 2 through 5. Step 7 - Repeat steps 2 and 3. Step 8 - Return the test item to standard ambient conditions and stabilize. 503.1-1 METHOD 503.1 10 March 1975