Downloaded from https://www.everyspec.com MIL-STD-810D 19 July 1983 II-3.3 cation test Step 1. Mount the test item and inetrumentation per paragraph II-2. Step 2. Start the test cycle developed from pa;agraph I-4.2.2. Step 3. in Step Functicn the test item while being expoaed to environmental stresses 4. Expose the test item to the number of test cycles decided on per paragraph I-3.3C. Step “4. Step 5. Check the teat item for functioning in accordance with General Requirements paragraph 4.5. Step 6. Repeat atepa 1 through 5 for each of the single or combined environ- ment testg specified in paragraph I-3.3.2 unless they were conducted as one test that combines all the environments. Step 7.
Dooument test aa given in paragraph II-4. 11-4 ~ a. Pretest, during test, and post-test performance data sccording to General Requirements, and the individual test specification and/or test.Plan. b. Test cycle, including environmental condition applied. c. Test time history of each failure occurrence. d. Nature of failure, including environmental effects. each test cycle. e .“ DC ripple voltage, as applied during the mission simulation portion of r. AC voltage variation, as conducted portion of each test cycle. during tha migsion-simulation g. Type, location, and orientation of stress-meaauring sensors. h. Description and calibration status equipment-. of data recording and analyaia i.
Voltage modulation, aa applied during the miaaion-aimulaticn portion of each teat cycle. ~. Frequency modulation, as applied during the ILIiSSiOn-simulation pOrtiOn of’each teat cycle. k. Electrical stress induced by mission-related transients within the electrical ayatem. 1. Prior teat hietory of teat item. m. Corrective action proposed. MSTHOD 520.0 19 JUIY 1983 520.0-27